Vulnerability

CVE-2024-53023

Location: OS
Memory corruption may occur while accessing a variable during extended back to back tests.

Impact

Severity (Manufact.)

HIGH

Severity (NIST)

N/A

Severity (Android)

N/A

Chipsets

2

Devices

0

Affected Hardware

NameAlso known asManufacturer
SDM429w
Wear 4100 and 4100+
Qualcomm
SW5100
W5 and W5+ Gen 1
Qualcomm
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Timeline

Introduced (est):
Apr 1, 2020
Reported:
Unknown
Advisory Published:
Mar 3, 2025
CVE Published:
N/A
Android Patch Level:
None
For more information and a detailed analysis of the data presented on this website, please see our paper, to be presented at NDSS'25.
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